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| IC Nexus provides ASIC testing service via close corporation with major testing houses in Taiwan. The testing scope covers a broad range of application fields from logic, mixed-signal, RF, to memory tests. IC Nexus integrates the testing development at competitive tooling cost and fast cycle time. |
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| Advantages |
- broad range of application fields available from a single service provider
- competitive development tooling cost and fast cycle time
- expert prototyping service |
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| Logic Test |
| Target Devices |
Any logic ASIC in data communication, PC peripheral, industrial, and consumer fields. |
| Tester Spec. |
Max I/Os: 128/256/304/384/448 pins, Max frequency: 10/50/100/200 MHz. |
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| Mixed - Signal Test |
| Target Devices |
Any mixed-signal or SoC ASIC in video, high-quality audio, speech reconnection applications. |
| Tester Spec. |
Max digital I/Os: 256/304/448 pins, Max digital frequency: 100/200 MHz; Max analog I/Os: 64 pins, Max analog measurement: ?0V/150mA, Max analog resolution: 16bits @100K sample/s. |
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| RF Test |
| Target Devices |
CDMA/GSM: RFPA, LMA, Mixer devices; Bluetooth/HomeRF: RF and IF ASICs; General wireless transceiver ASICs (Available in Q2, 2002) |
| Tester Spec. |
One test head and three RF ports, Vector test port: max 3GHz, Scalar test port: max 18GHz. |
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| Memory Test |
| Target Devices |
SRAM, DRAM, ROM, Flash Memory, and SIMM/DIMM module. |
| Tester Spec. |
Max I/Os: 576 pins, Max D/R: 960 pins, Max frequency: 250 MHz. |
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