By partnering with different assembly and test houses, IC Nexus is able to offer our customers a variety assembly and test solutions to meet your specific post-wafer processing demand.
At the moment, we specifically provides SiP/MCM, System in Package/Multi-Chip Module, assembly and test services to fulfill smaller size than individual IC, better electrical performance, lower cost, and time to market requirements.
Assembly
IC Nexus provides ASIC assembly service through the close corporation of major assembly houses throughout Asia. Most of the industrial standard packages are available for choice as needed. Other packages like CSP (Chip Scale Package), Flip BGA, etc., can also be accessed through IC Nexus at competitive development tooling cost and fast cycle time.
Advantages
- broad range of packages available from a single service provider
- competitive development tooling cost and fast cycle time
Test
IC Nexus provides ASIC testing service via close corporation with major testing houses in Taiwan. The testing scope covers a broad range of application fields from logic, mixed-signal, RF, to memory tests. IC Nexus integrates the testing development at competitive tooling cost and fast cycle time.
Advantages
- broad range of application fields available from a single service provider
- competitive development tooling cost and fast cycle time
- expert prototyping service
Logic Test
Target Devices |
Any logic ASIC in data communication, PC peripheral, industrial, and consumer fields. |
Tester Spec. |
Max I/Os: 128/256/304/384/448 pins, Max frequency: 10/50/100/200 MHz. |
Mixed - Signal Test
Target Devices |
Any mixed-signal or SoC ASIC in video, high-quality audio, speech reconnection applications. |
Tester Spec. |
Max digital I/Os: 256/304/448 pins, Max digital frequency: 100/200 MHz; Max analog I/Os: 64 pins, Max analog measurement: ?0V/150mA, Max analog resolution: 16bits @100K sample/s. |
RF Test
Target Devices |
CDMA/GSM: RFPA, LMA, Mixer devices; Bluetooth/HomeRF: RF and IF ASICs; General wireless transceiver ASICs (Available in Q2, 2002) |
Tester Spec. |
One test head and three RF ports, Vector test port: max 3GHz, Scalar test port: max 18GHz. |
Memory Test
Target Devices |
SRAM, DRAM, ROM, Flash Memory, and SIMM/DIMM module. |
Tester Spec. |
Max I/Os: 576 pins, Max D/R: 960 pins, Max frequency: 250 MHz. |